S&M Young Researcher Paper Award 2020
Recipients: Ding Jiao, Zao Ni, Jiachou Wang, and Xinxin Li [Winner's comments]
Paper: High Fill Factor Array of Piezoelectric Micromachined
Ultrasonic Transducers with Large Quality Factor

S&M Young Researcher Paper Award 2021
Award Criteria
Notice of retraction
Vol. 32, No. 8(2), S&M2292

Print: ISSN 0914-4935
Online: ISSN 2435-0869
Sensors and Materials
is an international peer-reviewed open access journal to provide a forum for researchers working in multidisciplinary fields of sensing technology.
Sensors and Materials
is covered by Science Citation Index Expanded (Clarivate Analytics), Scopus (Elsevier), and other databases.

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S&M2621 Research Paper of Special Issue

Imaging of Rough Surfaces by Near-field Measurement

Wei Chien, Chien-Ching Chiu, Po-Hsiang Chen, Hao Jiang, and Shun-Jie Chan

(Received December 31, 2020; Accepted April 20, 2021)

Keywords: microwave imaging, near-field measurement, rough surfaces, self-adaptive dynamic differential evolution (SADDE)

We have studied the near-field measurement of periodic non-flat surfaces and compared the error between the near-field and far-field measurement. Using known boundary conditions and recorded scattering data, we derived a group of matrix functions that can be converted into an external problem, and then used the self-adaptive dynamic differential evolution (SADDE) method to recover the shape, periodic length, and dielectric constant of surfaces. We compared the search speed and stability of the surface reconstruction. Using the SADDE method to reconstruct a periodic non-flat surface, regardless of the initial estimate, the SADDE method converged to the global extreme. In a numerical simulation, even if the initial estimate was much larger than the true value, we could still find an accurate numerical solution and successfully reconstruct the surface shape function, period length, and relative dielectric constant. The simulation results show that the error in the near-field measurement is smaller than that in the far-field measurement.

Corresponding author: Chien-Ching Chiu




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